AOI Defect Inspection & Measurement Machine
Using AOI-detected position data, defects can be selected with high magnification and a wide field of view, then captured to complete the inspection. Users can zoom in on images using the mouse scroll wheel, significantly reducing labor costs.
Comparison
- Traditional Microscope
For a 50 μm black spot, the human eye can barely detect its location. Due to the high precision required, operators must sequentially use low, medium, and high magnification lenses to accurately mark defects, which is both time-consuming and labor-intensive.
- Review System
Using AOI-detected position data, defects can be selected with high magnification and a wide field of view, then captured to complete the inspection. Users can zoom in on images using the mouse scroll wheel, significantly reducing labor costs.
ReView System Accessories & Specifications
- Color 20 Megapixel Camera
- TOYO Dust-Free Linear Rail
- LED Ring Light
- Ultra-High Precision: 1.5 μm
- High-Resolution Imaging
Achieves low-noise, outstanding image quality to capture the smallest details, enabling accurate and complex image analysis. - Conical Convergent Illumination
Creates a circular, high-brightness lighting area covering the target object, eliminating dead zones and enhancing visual inspection effectiveness.
AOI System Custom Configuration
Station 1 (Optional)
- Precision: 10 μm/pixel
- Monochrome CCD Array
Station 2 (Optional)
- Precision: 20 μm/pixel
- Color CCD Array
AOI Defect Precision Comparison
System Diagram
AOI Review System Camera
AOI Review Inspection Machine
